ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,146, issued on Nov. 4, was assigned to NXP B.V. (Eindhoven, Netherlands).
"Analog phase selection test system" was invented by Andreas Johannes Kollmann (Rosengarten, Germany) and Ulrich Moehlmann (Moisburg, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a phase-shift to duty-cycle converter and a low pass filter. The phase-shift to duty-cycle converter has a first input for a reference clock and a second input for a phase-shifted clock that is phase-shifted relative to the reference clock. The low pass filter has an input coupled to an output of the phase-shift to duty-cycle converter and an output for an output signal. In ...