ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,476,786, issued on Nov. 18, was assigned to NXP B.V. (Eindhoven, Netherlands).

"Statistical ineffective fault analysis protection of Sbox" was invented by Ventzislav Nikov (Haasrode, Belgium) and Martin Heinrich Butkus (Hamburg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A protection circuit for a Sbox, including: a first check circuit configured to determine if a most significant bit (MSB) part input into a first multiplier of the Sbox is zero; a second check circuit configured to determine if a CCn value input into the first multiplier and a second multiplier of the Sbox is zero; a third check circuit configured to determine if a least sig...