US Patent Issued to NXP on Nov. 18 for "Analog test devices for integrated circuits with multiple power domains" (Indian Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,399, issued on Nov. 18, was assigned to NXP B.V. (Eindhoven, Netherlands).

"Analog test devices for integrated circuits with multiple power domains" was invented by Prashant Goyal (Noida, India) and Vigyan Jain (Rewari, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An analog circuit includes an analog test bus; a plurality of analog circuits including a first analog circuit, each of the plurality of analog circuits associated with a corresponding one of a plurality of power domains; a first plurality of transmission gates coupled between the first analog circuit and the analog test bus; and a first protection device coupled between the first ...