US Patent Issued to NXP on May 6 for "System for controlling leakage current in integrated circuits" (Indian, American Inventors)

ALEXANDRIA, Va., June 10 -- United States Patent no. 12,294,359, issued on May 6, was assigned to NXP B.V. (Eindhoven, Netherlands).

"System for controlling leakage current in integrated circuits" was invented by Sanjay Kumar Wadhwa (Noida, India), Divya Tripathi (Noida, India), Saurabh Goyal (Sonipat, India), Alvin Leng Sun Loke (San Diego) and Manish Kumar Upadhyay (New Delhi).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC) includes one or more active transistors and multiple series-coupled dummy transistors. The dummy transistors are coupled between two active transistors and/or at the ends of each active transistor. When the dummy transistors are coupled between two active transi...