US Patent Issued to NXP on June 3 for "Tough panel location detection with different frequency-phase offset combinations of electrode signals" (French Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,321,548, issued on June 3, was assigned to NXP B.V. (Eindhoven, Netherlands).

"Tough panel location detection with different frequency-phase offset combinations of electrode signals" was invented by Franck Goussin (Blainville sur Orne, France), Frederic Darthenay (Luc sur Mer, France), Jean-Robert Tourret (Cormelles le Royal, France) and Vincent Geffroy (Cuverville, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A touch panel system that includes drivers for providing detection signals on a first plurality of electrodes of a touch panel where each detection signal includes one or more frequency signal components with each frequency signal componen...