US Patent Issued to NXP on June 24 for "Mass-production testing for launcher-in-package with through-board waveguide" (German, Dutch Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,316, issued on June 24, was assigned to NXP B.V. (Eindhoven, Netherlands).

"Mass-production testing for launcher-in-package with through-board waveguide" was invented by Giorgio Carluccio (Eindhoven, Netherlands), Bjorn Christian Brands (Rellingen, Germany) and Henrik Asendorf (Hamburg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A two-stage test process for testing IC packages having integrated launchers includes a first stage in which an RF-accurate test process is used to perform RF-accurate tests on a sample set of IC packages to obtain RF-accurate test results and a loop-back test process is performed to obtain loop-back test results...