US Patent Issued to NXP on Dec. 16 for "System and method for validating critical paths of integrated circuits" (Indian Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,500,580, issued on Dec. 16, was assigned to NXP B.V. (Eindhoven, Netherlands).

"System and method for validating critical paths of integrated circuits" was invented by Ashish Goel (Noida, India), Ajay Sharma (New Delhi), Ruchi Bora (Lucknow, India) and Umesh Pratap Singh (Hodal, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A validation circuit is placed in vicinity of a critical path for testing the critical path. The validation circuit receives test data from the control circuit for testing the critical path. The test data is indicative of a delay value that is associated with the critical path. The validation circuit generates multiple setup s...