US Patent Issued to NVIDIA on Nov. 25 for "Technique for enabling on-die noise measurement during ate testing and IST" (California Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,990, issued on Nov. 25, was assigned to NVIDIA Corp. (Santa Clara, Calif.).

"Technique for enabling on-die noise measurement during ate testing and IST" was invented by Bonita Bhaskaran (Santa Clara, Calif.), Nithin Valentine (Santa Clara, Calif.), Shantanu Sarangi (Santa Clara, Calif.), Mahmut Yilmaz (Santa Clara, Calif.), Suhas Satheesh (Santa Clara, Calif.), Charlie Hwang (Santa Clara, Calif.), Tezaswi Raja (Santa Clara, Calif.), Kevin Zhou (Santa Clara, Calif.), Sailendra Chadalavada (Santa Clara, Calif.), Kevin Ye (Santa Clara, Calif.), Seyed Nima Mozaffari Mojaveri (Santa Clara, Calif.) and Kerwin Fu (Santa Clara, Calif.).

According to the abstract* released by the U.S. Pat...