US Patent Issued to Nuvoton Technology on July 1 for "Comparator testing circuit and testing method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,763, issued on July 1, was assigned to Nuvoton Technology Corp. (Hsinchu, Taiwan).

"Comparator testing circuit and testing method thereof" was invented by Chih-Ping Lu (Hsinchu, Taiwan) and Cheng-Chih Wang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A comparator testing circuit and a testing method are provided. The comparator testing circuit includes a switching circuit, a comparator, and a determination circuit. The switching circuit receives a first signal, a second signal, and a switching signal, and outputs one of the first signal and the second signal as a first input signal and the other of the first signal and the second s...