US Patent Issued to Nuvoton Technology on Dec. 16 for "Tracking and prevention of fault injection attempt sequences using thermal memory" (Israeli Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,227, issued on Dec. 16, was assigned to Nuvoton Technology Corp. (Hsinchu, Taiwan).

"Tracking and prevention of fault injection attempt sequences using thermal memory" was invented by Yuval Kirschner (Even Yehuda, Israel), Tamir Golan (Kibbutz Givaat-Chaim Meuchad, Israel) and Ziv Hershman (Givat Shmuel, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC) includes a thermal memory device, a fault injection (FI) detector and a security control circuit. The thermal memory device includes (i) a thermal storage zone and (ii) a heating element configured to heat the thermal storage zone in response to write operations. The FI...