US Patent Issued to NuVolta Technologies (Hefei) on Dec. 16 for "Voltage sampling apparatus and method" (California, Massachusetts, Oregon Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,427, issued on Dec. 16, was assigned to NuVolta Technologies (Hefei) Co. Ltd. (Hefei, China).

"Voltage sampling apparatus and method" was invented by Li Lu (San Diego), Olivier Gerard Metayer (Beaverton, Ore.) and Paul Gunaratnam (Milford, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes a first sampling switch coupled between a first voltage bus and a sampling capacitor, a first clock generator configured to produce a first gate drive signal fed into a gate of the first sampling switch, the first clock generator comprising a first capacitive coupled clock shifter, a first reset circuit and a second reset circuit, a second ...