US Patent Issued to NuFlare Technology on June 17 for "Method for searching for hole pattern in image, pattern inspection method, pattern inspection apparatus, and apparatus for searching hole pattern in image" (Japanese Inventor)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,781, issued on June 17, was assigned to NuFlare Technology Inc. (Yokohama, Japan).

"Method for searching for hole pattern in image, pattern inspection method, pattern inspection apparatus, and apparatus for searching hole pattern in image" was invented by Shinji Sugihara (Ota-ku, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Method for searching a hole pattern in image includes extracting, from an image where a hole pattern is formed, plural outline position candidates serving as candidates for plural positions where an outline of the hole pattern passes, generating, for each pixel in a region including the plural outline position candidates,...