US Patent Issued to NUCTECH on Sept. 30 for "Radiation inspection device" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,623, issued on Sept. 30, was assigned to NUCTECH COMPANY Ltd. (Beijing).

"Radiation inspection device" was invented by Lei Liu (Beijing), Zheng Ji (Beijing), Shangmin Sun (Beijing), Chunguang Zong (Beijing), Yu Hu (Beijing) and Yuan Ma (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a radiation inspection device, which has a transportation state and a working state, and includes a container with an adjustable width, and the width of the container in the transportation state is smaller than that in the working state; a radiation inspection apparatus arranged in the container and including a radiation source an...