US Patent Issued to NUCTECH on May 13 for "Backscatter imaging device, control method and inspection system" (Chinese Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,261, issued on May 13, was assigned to NUCTECH COMPANY Ltd. (Beijing).

"Backscatter imaging device, control method and inspection system" was invented by Zhiqiang Chen (Beijing), Yuanjing Li (Beijing), Shangmin Sun (Beijing), Chunguang Zong (Beijing), Yu Hu (Beijing), Huaping Tang (Beijing), Bicheng Liu (Beijing) and Weizhen Wang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of bac...