ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,497, issued on Dec. 30, was assigned to NUCTECH COMPANY Ltd. (Beijing) and Tsinghua University (Beijing).
"Inspection system and method" was invented by Zhiqiang Chen (Beijing), Li Zhang (Beijing), Qingping Huang (Beijing), Yong Zhou (Beijing), Hui Ding (Beijing), Xin Jin (Beijing) and Chao Ji (Beijing).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system and method, and the system includes: a ray source; a detector assembly; and a conveying device for carrying an aviation pallet cargo. The ray source and the detector assembly are movable in a traveling direction parallel to the central axis relative to the conveying device so that the...