US Patent Issued to NTT on Oct. 21 for "Method and apparatus for detecting deterioration factor of wireless quality" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,452,710, issued on Oct. 21, was assigned to NTT Inc. (Tokyo).

"Method and apparatus for detecting deterioration factor of wireless quality" was invented by Toshifumi Miyagi (Musashino, Japan), Kazuo Osaka (Musashino, Japan), Hiroyuki Furuya (Musashino, Japan), Hitoshi Hasegawa (Musashino, Japan), Hayato Fukuzono (Musashino, Japan), Fumiaki Nagase (Musashino, Japan), Yu Ono (Musashino, Japan) and Keita Kuriyama (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A wireless quality degradation factor detection method according to an embodiment includes a spectrum generation step of generating a spectrum based on a received radio wave, a deter...