US Patent Issued to NTT on Nov. 4 for "Multipath interference analysis device and multipath interference analysis method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,724, issued on Nov. 4, was assigned to NTT Inc. (Tokyo).

"Multipath interference analysis device and multipath interference analysis method" was invented by Hiroki Kawahara (Musashino, Japan) and Takeshi Seki (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multipath interference analysis device includes a statistical amount calculation unit that calculates statistical amounts of respective measurement values of splice loss measured from a plurality of optical fiber pieces for forming an optical transmission line, and measurement values of cutoff wavelength, a determination unit that determines a truncated normal distribution from a...