US Patent Issued to NTT on Nov. 4 for "Dielectric spectroscopy measuring device and dielectric spectroscopy measuring method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,043, issued on Nov. 4, was assigned to NTT Inc. (Tokyo).

"Dielectric spectroscopy measuring device and dielectric spectroscopy measuring method" was invented by Masahito Nakamura (Musashino, Japan), Takuro Tajima (Musashino, Japan) and Michiko Seyama (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A dielectric spectroscopy measuring device includes a signal generation unit that generates electromagnetic waves, a signal separation unit that separate the electromagnetic waves according to a transmission direction and outputs the separated electromagnetic waves to an output destination corresponding to the transmission direction, a chan...