US Patent Issued to NTT on Jan. 27 for "Test code generator, test code generation method, and, test code generation program" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,095, issued on Jan. 27, was assigned to NTT Inc. (Tokyo).

"Test code generator, test code generation method, and, test code generation program" was invented by Sho Kanemaru (Musashino, Japan), Yukitsugu Sasaki (Musashino, Japan), Kensuke Takahashi (Musashino, Japan) and Tsuyoshi Toyoshima (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test code generation device includes an action generation unit that acquires at least one of pieces of API-related data of an API specification, an API execution order file, a parameter setting file, a script setting file, a test type, and a parameter list and generates action code data correspondin...