ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,182, issued on May 13, was assigned to NOVA LTD. (Rehovot, Israel).
"Optical technique for material characterization" was invented by Gilad Barak (Rehovot, Israel) and Yonatan Oren (Kiryat Ono, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A polarized Raman Spectrometric system for defining parameters of a polycrystalline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multip...