ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,413,319, issued on Sept. 9, was assigned to Northrop Grumman Systems Corp. (Falls Church, Va.).
"Testing a signal path" was invented by David I. Cross (Jessup, Md.), Jonathan D. Egan (Hanover, Md.), Robert J. March (Bel Air, Md.) and Ty L. Barkdoll (Columbia, Md.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present disclosure relate generally to testing one or more signal paths. For example, a signal path may include a phase shifter that may impart a phase shift to signals passing through the signal path. Some embodiments may test a phase shift imparted to a signal by the signal path, including the phase shifter. Some embodiments m...