US Patent Issued to Nordson on June 17 for "X-ray inspection system, an x-ray imaging accessory, a sample support, a kit, and a method of using an x-ray inspection system" (British Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,189, issued on June 17, was assigned to Nordson Corp. (Westlake, Ohio).

"X-ray inspection system, an x-ray imaging accessory, a sample support, a kit, and a method of using an x-ray inspection system" was invented by Bill Walker (Suffolk, Great Britain) and David Sutton (Essex, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "An x-ray inspection system comprising an x-ray source, an x-ray detector, a sample support comprising a pliable material and a sample support positioning assembly configured to position the sample support between the x-ray source and the x-ray detector. The sample support is configured to removably clamp a sample fo...