ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,560, issued on Feb. 3, was assigned to Nordic Semiconductor ASA (Trondheim, Norway).
"Testing ADCs" was invented by Henrik Fon (Trondheim, Norway).
According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit portion is provided which is arranged to be operable in a test mode. The circuit portion includes a Successive Approximation Register Analog to Digital Converter, SAR ADC, and an input for a reference signal. The SAR ADC is arranged to generate a feedback signal having a duty cycle representing a time taken for the SAR ADC to complete an analogue to digital conversion. The SAR ADC can carry out a comparison of a duty cycle of the reference signal with...