US Patent Issued to Nomura Research Institute on July 15 for "3-dimension parcel measurement device according to a captured image and depth measurement" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,361,581, issued on July 15, was assigned to Nomura Research Institute Ltd. (Tokyo).

"3-dimension parcel measurement device according to a captured image and depth measurement" was invented by Menglong Yang (Kanagawa, Japan), Satomi Tanabe (Tokyo), Satoshi Takahashi (Kanagawa, Japan) and Naoki Shimizu (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The shape of an object is measured with high accuracy. A measurement system includes a frame recognition unit configured to detect one or more frames indicating a straight line portion from a captured image, a depth measurement unit configured to perform depth measurement, and a dimension estimation unit...