ALEXANDRIA, Va., April 9 -- United States Patent no. 12,273,756, issued on April 8, was assigned to Nokia Technologies (Espoo, Finland).
"Beam based criteria evaluation for adaptation of RRM measurements" was invented by Timo Koskela (Oulu, Finland), Jorma Kaikkonen (Oulu, Finland) and Jussi-Pekka Koskinen (Oulu, Finland).
According to the abstract* released by the U.S. Patent & Trademark Office: "According to a first embodiment, an apparatus may include at least one processor and at least one memory including computer program code. The at least one memory and the computer program code can be configured to, with the at least one processor, cause the apparatus to at least determine at least one reference value configured to evaluate at lea...