ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,459,234, issued on Nov. 4, was assigned to NITTO DENKO Corp. (Ibaraki, Japan).
"Multilayer structure" was invented by Takeshi Murashige (Osaka, Japan), Junichi Inagaki (Osaka, Japan), Keisuke Sato (Osaka, Japan) and Atsushi Kishi (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A multilayer structure includes a resin layer, and a glass layer laminated on the resin layer via an adhesive layer, wherein a thickness of the glass layer is 10 micro metre or more and 300 micro metre or less, and an arithmetic mean waviness Wa of an interface of the resin layer and the adhesive layer is 10 micro metre or less."
The patent was filed on March 10, 2021...