US Patent Issued to Nissan Motor on March 25 for "Abnormality detection device and abnormality detection method" (Japanese Inventor)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,257,704, issued on March 25, was assigned to Nissan Motor Co. Ltd. (Yokohama, Japan).

"Abnormality detection device and abnormality detection method" was invented by Yasuhiro Tanaka (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detection device detects an abnormality of a device based on time-series data acquired from a device having a movable part. The abnormality determination device determines whether time-series data at a specific time have increased or decreased with respect to time-series data from a certain time prior to the specific time as the specific time is shifted, indicates an increase or decrease of the t...