ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,374, issued on Oct. 7, was assigned to NIKON Corp. (Tokyo).
"Microscope, observation method, and program" was invented by Yamato Niitani (Yokohama, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A microscope includes light-transmitting-optical-system that irradiates specimen with illumination-light, light-receiving-optical-system that receives signal-light emitted from the specimen, phase-modulation-element that adds predetermined phase distribution to the illumination-light or the signal-light, phase-distribution-measuring-unit that measures first phase distribution, which corresponds to specimen-induced aberration at sampling point of the spe...