US Patent Issued to NIKON on Oct. 28 for "Microscope apparatus, sample refractive index measurement method for microscope apparatus, and sample refractive index measurement program for microscope apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,438, issued on Oct. 28, was assigned to NIKON Corp. (Tokyo).

"Microscope apparatus, sample refractive index measurement method for microscope apparatus, and sample refractive index measurement program for microscope apparatus" was invented by Yamato Niitani (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A microscope apparatus comprises: an illumination optical system that guides light from a light source to a sample; a detection unit that detects light from the sample; a detection optical system that has an objective lens and guides light from the sample to the detection unit; a mask that allows a portion of light from the sample an...