US Patent Issued to NIKON on Oct. 14 for "Position measurement device and position measurement method" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,633, issued on Oct. 14, was assigned to NIKON Corp. (Tokyo).

"Position measurement device and position measurement method" was invented by Shinji Sato (Fukaya, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A position measurement device includes a position measurement unit configured to irradiate measurement light to a reflective element, receive reflected light reflected by the reflective element, and acquire position information of the reflective element in a three-dimensional space and a reference position measurement unit configured to irradiate reference measurement light to at least one reference reflective element, receive reference ref...