US Patent Issued to NIKON on May 27 for "Image analyzer, cell culture observation device, image analysis method, program, and data processing system" (Japanese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,162, issued on May 27, was assigned to NIKON Corp. (Tokyo).

"Image analyzer, cell culture observation device, image analysis method, program, and data processing system" was invented by Toru Ichihashi (Yokohama, Japan) and Yoichi Yamazaki (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An image analyzer including: an area setting unit configured to extract a scratch area that is an area having no cells from a reference image selected from a plurality of images acquired by imaging cells in a time series and set a reference region corresponding to the scratch area in the plurality of images; a calculation unit configured to calculate a...