US Patent Issued to NIKON on April 29 for "Measurement device" (Japanese Inventor)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,285,216, issued on April 29, was assigned to NIKON Corp. (Tokyo).

"Measurement device" was invented by Shunsuke Furuya (Kumagaya, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement device including a light source configured to emit a broad-band light beam, an interference section configured to split the broad-band light beam into a measurement light beam and a reference light beam, and to generate an interference light beam from the reference light beam and a measurement light beam reflected from an object after shining the measurement light beam onto the object, a sweeper section configured to perform wavelength sweeping of the interfere...