US Patent Issued to NIHON KOHDEN on April 1 for "Probe apparatus and manufacturing method for probe apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 2 -- United States Patent no. 12,265,117, issued on April 1, was assigned to NIHON KOHDEN Corp. (Tokyo).

"Probe apparatus and manufacturing method for probe apparatus" was invented by Shohei Nishina (Tokorozawa, Japan) and Mitsuo Oshima (Tokorozawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe apparatus includes a sensor including at least one element, a plurality of electrically conductive wires each of which has a connection portion at which electrical connection is made between the electrically conductive wire and the sensor so that a signal used in the sensor can flow through the electrically conductive wire, and an insulative member configured to cover at least one...