US Patent Issued to NIDEK on July 8 for "Eyeglasses lens measurement device and non-transitory computer-readable storage medium" (Japanese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,651, issued on July 8, was assigned to NIDEK Co. LTD. (Aichi, Japan).

"Eyeglasses lens measurement device and non-transitory computer-readable storage medium" was invented by Katsuyasu Mizuno (Aichi, Japan), Toshihiro Kobayashi (Aichi, Japan), Yujiro Tochikubo (Aichi, Japan) and Yuichi Matsubara (Aichi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An eyeglasses lens measurement device measures an eyeglasses lens of eyeglasses. The eyeglasses lens measurement device includes a light source that emits a measurement light flux toward the eyeglasses lens, a transmissive display that transmits the measurement light flux from the light source and d...