US Patent Issued to NIDEK on July 1 for "Ophthalmologic measurement apparatus, ophthalmologic measurement system, and ophthalmologic measurement program" (Japanese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,343,082, issued on July 1, was assigned to NIDEK Co. LTD. (Aichi, Japan).

"Ophthalmologic measurement apparatus, ophthalmologic measurement system, and ophthalmologic measurement program" was invented by Michihiro Takii (Aichi, Japan), Masanori Yatani (Aichi, Japan), Kazunari Shimizu (Aichi, Japan) and Tetsuya Yamamoto (Aichi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided an ophthalmologic measurement apparatus for measuring a subject eye. The apparatus includes measurement means for objectively measuring eye refractive power of the subject eye, acquisition means for acquiring intraocular lens information relating to an intraocul...