US Patent Issued to NICHIA on Sept. 30 for "Characteristic value correction device, characteristic value calculation device, inspection device including the same, characteristic value correction method, light-emitting device, and characteristic value correction program" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,374, issued on Sept. 30, was assigned to NICHIA Corp. (Anan, Japan).

"Characteristic value correction device, characteristic value calculation device, inspection device including the same, characteristic value correction method, light-emitting device, and characteristic value correction program" was invented by Yoshiki Yamaji (Anan, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A characteristic value correction device includes a waveform acquiring unit, an area calculating unit, a time calculating unit, and a correction coefficient calculating unit. The waveform acquiring unit is configured to acquire a waveform indicating a relationship bet...