ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,717, issued on Jan. 20, was assigned to NGK INSULATORS Ltd. (Nagoya, Japan).
"Electronic component inspection method" was invented by Ryusuke Ikeda (Ichinomiya, Japan), Tomohiko Hibino (Inazawa, Japan) and Takao Ohnishi (Fuso-cho, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic component includes a first surface with a first electrode and a second surface with a second electrode. A measuring instrument includes a first terminal and a second terminal. Only the second surface out of the first surface and the second surface is adhered to a conductive adhesive sheet. The first terminal of a measuring instrument is electrically connect...