US Patent Issued to New York University on July 8 for "System and method for magnetic resonance mapping of physical and chemical changes in conducting structures" (American, Argentinean Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,711, issued on July 8, was assigned to New York University (New York).

"System and method for magnetic resonance mapping of physical and chemical changes in conducting structures" was invented by Alexej Jerschow (New York), Andrew J. Ilott (Belle Mead, N.J.), Mohaddese Mohammadi (Brooklyn, N.Y.), Emilia Silletta (Cordoba, Argentina) and Konstantin Romanenko (New York).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of diagnosing a conducting structure includes providing the conducting structure in a magnetic field, immersing the conducting structure in a detection medium, or placing a detection medium in the vicinity of the conducting structur...