US Patent Issued to New York University on Jan. 20 for "Systems and methods for magnetic susceptometry of devices with magnetometry" (German, Argentinean, American Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,725, issued on Jan. 20, was assigned to New York University (New York).

"Systems and methods for magnetic susceptometry of devices with magnetometry" was invented by Alexej Jerschow (New York), Mohaddese Mohammadi (Brooklyn, N.Y.), Emilia Silletta (Cordoba, Argentina), Dmitry Budker (Mainz, Germany), Geoffrey Z. Iwata (Mainz, Germany), Yinan Hu (Mainz, Germany), Arne Wickenbrock (Mainz, Germany) and John Blanchard (Mainz, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of diagnosing internal characteristics of a device includes applying a strong magnetic field to the device. The method can include reducing the strong magnetic field a...