US Patent Issued to New Jersey Institute of Technology on April 22 for "Optically computed phase microscopy" (New Jersey Inventors)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,281,888, issued on April 22, was assigned to New Jersey Institute of Technology (Newark, N.J.).

"Optically computed phase microscopy" was invented by Xuan Liu (Berkeley Heights, N.J.), Yuwei Liu (Harrison, N.J.), Yuanwei Zhang (New Providence, N.J.) and Zhaoxiong Wan (Newark, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Optically computed phase imaging systems and methods are provided. An example system includes an interferometer configured to output 3D spatial-spectral data of a sample including an interferometric signal and an optical computation assembly having a spatial light modulator configured to modulate the 3D spatial-spectral data with a...