ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,488, issued on July 29, was assigned to Nevada Nanotech Systems Inc. (Sparks, Nev.).

"Methods for determining at least one property of a material, and related detector" was invented by Benjamin S. Rogers (Reno, Nev.), Christopher J. Dudley (Reno, Nev.), Jesse D. Adams (Reno, Nev.), Ralph G. Whitten (Reno, Nev.), Alexander C. Woods (Reno, Nev.) and Vaughn N. Hartung (Reno, Nev.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for determining one or more properties of one or more gases. The system comprises sensors configured to measure thermal conductivity and exothermic responses of a sample at multiple temperatures. Sensor responses to expos...