US Patent Issued to NETZSCH-Geratebau on Sept. 23 for "Device and method for a thermal analysis of a sample" (German Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,390, issued on Sept. 23, was assigned to NETZSCH-Geratebau GmbH (Selb, Germany).

"Device and method for a thermal analysis of a sample" was invented by Ekkehard Fuglein (Selb, Germany) and Georg Neumann (Schonwald, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A thermal analysis of samples and proposes a device for a thermal analysis of a sample, having: a sample chamber for receiving a sample crucible including a crucible cover attached thereto, in the interior of which a sample to be analyzed is located, wherein the sample chamber has a chamber opening for introducing the sample crucible into the sample chamber; a temperature control mec...