US Patent Issued to NEC on Sept. 23 for "Parameter determination apparatus, parameter determination method and recording medium" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,423,867, issued on Sept. 23, was assigned to NEC Corp. (Tokyo).

"Parameter determination apparatus, parameter determination method and recording medium" was invented by Chisato Funayama (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A parameter determination apparatus (3) includes: a calculation unit (313) that is configured to calculate, based on a recognized result of a plurality of recognition target images by a recognition apparatus (2) that performs a recognition operation on the recognition target image (100, 200), an evaluation value for evaluating the recognized result; and a determination unit (314) that is configured to determine, base...