US Patent Issued to NEC on Sept. 2 for "Queue analysis apparatus, control method, and non-transitory computer-readable medium" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,406,465, issued on Sept. 2, was assigned to NEC Corp. (Tokyo).

"Queue analysis apparatus, control method, and non-transitory computer-readable medium" was invented by Hiroo Ikeda (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A queue analysis apparatus (2000) estimates a position and an orientation of each object (20) included in a target image (10). The target image (10) is generated by a camera (50) that captures the object (20). The queue analysis apparatus (2000) generates a queue line (40) that expresses, by a linear shape, a queue included in a queue region (30) being a region representing a queue in the target image (10), based on a positi...