US Patent Issued to NEC on Sept. 16 for "Measurement method, measurement device, and nontransitory computer-readable medium" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,574, issued on Sept. 16, was assigned to NEC Corp. (Tokyo).

"Measurement method, measurement device, and nontransitory computer-readable medium" was invented by John Kenji Clark (Tokyo) and Shigeru Nakamura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement method according to an example embodiment executed by a computer includes: selecting one of a plurality of sample wavelengths as a wavelength of output light of a semiconductor wavelength-tunable laser, and controlling output of the output light in such a way that the selected one sample wavelength discretely and sequentially changes with time; acquiring, for each of the plurali...