US Patent Issued to NEC on Oct. 7 for "Log generation apparatus, abnormality detection system, log generation method, and non-transitory computer readable medium" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,061, issued on Oct. 7, was assigned to NEC Corp. (Tokyo).

"Log generation apparatus, abnormality detection system, log generation method, and non-transitory computer readable medium" was invented by Daichi Hasumi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A log generation apparatus includes an input operation log collection unit that collects input operation logs in which an operation event of an input device is recorded; an information log collection unit that collects information logs in which a process event related to processing performed by an information apparatus connected to the input device is recorded, the information logs being ...