US Patent Issued to NEC on Oct. 21 for "Measurement apparatus, information processing apparatus, data specifying method, and non-transitory computer-readable medium" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,542, issued on Oct. 21, was assigned to NEC Corp. (Tokyo).

"Measurement apparatus, information processing apparatus, data specifying method, and non-transitory computer-readable medium" was invented by Jiro Abe (Tokyo), Akira Tsuji (Tokyo), Junichi Abe (Tokyo) and Yoshimasa Ono (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement apparatus according to the present disclosure includes a position specifying unit configured to specify, using an apparatus reference coordinate system having a position of the measurement apparatus set as a reference, a position of each of a plurality of other measurement apparatuses; a candidate specifying ...