ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,444,070, issued on Oct. 14, was assigned to NEC Corp. (Tokyo).
"Measuring method, measuring apparatus, and measuring system" was invented by Shinya Yasuda (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A target-object-encompassing region representing a region causing any change between first image information and second image information is determined based on the first image information precluding a target object in an imageable area and the second image information including the target object in the imageable area. A two-dimensional size of the target object included in the target-object-encompassing region is determined based on the target-obj...