US Patent Issued to NEC on Nov. 4 for "Step width measurement device, measurement system, step width measurement method, and program for decision making related to user's walking" (Japanese Inventor)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,458,247, issued on Nov. 4, was assigned to NEC Corp. (Tokyo).

"Step width measurement device, measurement system, step width measurement method, and program for decision making related to user's walking" was invented by Hiroshi Kajitani (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A step width measurement device includes a distance calculation unit that calculates a distance between both feet of a user by using propagation data related to transmission/reception times of ultrasonic waves transmitted/received by ultrasonic transmission/reception devices mounted on each of the both feet of the user, a height calculation unit that calculates a heigh...