US Patent Issued to NEC on May 6 for "Tamper detection feature embedding device, tamper detection feature embedding method, and computer readable medium" (Japanese Inventors)

ALEXANDRIA, Va., June 10 -- United States Patent no. 12,293,172, issued on May 6, was assigned to NEC Corp. (Tokyo).

"Tamper detection feature embedding device, tamper detection feature embedding method, and computer readable medium" was invented by Yuto Hayaki (Tokyo) and Norio Yamagaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device inputs a first source code, which is source code of the software to be monitored; builds the first source code to generate a first binary; generates a first CFG based on the first binary; embeds a tamper detection feature and tamper detection feature calling functions in a first source code based on the first CFG to generate a second source code, builds a second ...